=== START OF INFORMATION SECTION ===
Model Family: Western Digital Red
Device Model: WDC WD30EFRX-68EUZN0
Serial Number: WD-WMC4N0438887
LU WWN Device Id: 5 0014ee 058fbf15b
Firmware Version: 82.00A82
User Capacity: 3,000,592,982,016 bytes [3.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Feb 25 06:32:11 2016 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (40500) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 406) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x703d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 253 051 - 0
3 Spin_Up_Time POS--K 100 253 021 - 0
4 Start_Stop_Count -O--CK 100 100 000 - 1
5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0
7 Seek_Error_Rate -OSR-K 200 200 000 - 0
9 Power_On_Hours -O--CK 100 100 000 - 134
10 Spin_Retry_Count -O--CK 100 253 000 - 0
11 Calibration_Retry_Count -O--CK 100 253 000 - 0
12 Power_Cycle_Count -O--CK 100 100 000 - 1
192 Power-Off_Retract_Count -O--CK 200 200 000 - 0
193 Load_Cycle_Count -O--CK 200 200 000 - 2
194 Temperature_Celsius -O---K 119 113 000 - 31
196 Reallocated_Event_Count -O--CK 200 200 000 - 0
197 Current_Pending_Sector -O--CK 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 253 000 - 0
199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 14
200 Multi_Zone_Error_Rate ---R-- 100 253 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 5 Comprehensive SMART error log
0x03 GPL R/O 6 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters
0x21 GPL R/O 1 Write stream error log
0x22 GPL R/O 1 Read stream error log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0-0xa7 GPL,SL VS 16 Device vendor specific log
0xa8-0xb7 GPL,SL VS 1 Device vendor specific log
0xbd GPL,SL VS 1 Device vendor specific log
0xc0 GPL,SL VS 1 Device vendor specific log
0xc1 GPL VS 93 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
ATA_READ_LOG_EXT (addr=0x03:0x00, page=0, n=1) failed: Input/output error
Read SMART Extended Comprehensive Error Log failed
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 103 hours (4 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 00 18 ab 3f 46 Error: IDNF at LBA = 0x063fab18 = 104835864
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 00 18 ab 3f 46 08 4d+07:13:21.167 WRITE DMA
ef 02 00 00 00 00 40 00 4d+07:13:21.167 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 40 00 4d+07:13:21.166 SET FEATURES [Enable read look-ahead]
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 258 (0x0102)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 34 Celsius
Power Cycle Min/Max Temperature: 23/36 Celsius
Lifetime Min/Max Temperature: 23/36 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/60 Celsius
Min/Max Temperature Limit: -41/85 Celsius
Temperature History Size (Index): 478 (9)
Index Estimated Time Temperature Celsius
10 2016-02-24 22:35 ? -
... ..(467 skipped). .. -
0 2016-02-25 06:23 ? -
1 2016-02-25 06:24 23 ****
2 2016-02-25 06:25 34 ***************
3 2016-02-25 06:26 34 ***************
4 2016-02-25 06:27 31 ************
5 2016-02-25 06:28 35 ****************
6 2016-02-25 06:29 32 *************
7 2016-02-25 06:30 36 *****************
8 2016-02-25 06:31 35 ****************
9 2016-02-25 06:32 34 ***************
SCT Error Recovery Control:
Read: 70 (7.0 seconds)
Write: 70 (7.0 seconds)
Device Statistics (GP Log 0x04) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 14 Command failed due to ICRC error
0x0002 2 18718 R_ERR response for data FIS
0x0003 2 18718 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 56675 R_ERR response for non-data FIS
0x0006 2 56598 R_ERR response for device-to-host non-data FIS
0x0007 2 77 R_ERR response for host-to-device non-data FIS
0x0008 2 8393 Device-to-host non-data FIS retries
0x0009 2 41163 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 41154 Device-to-host register FISes sent due to a COMRESET
0x000b 2 72 CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0012 2 72 R_ERR response for host-to-device non-data FIS, CRC
0x8000 4 484480 Vendor specific