root@freenas[~]# smartctl -a /dev/ada3
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-PRERELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke,
www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar Blue (SATA)
Device Model: WDC WD7500AAKS-00RBA0
Serial Number: WD-WCAPT0122907
LU WWN Device Id: 5 0014ee 2aaf96ec3
Firmware Version: 30.04G30
User Capacity: 750,156,374,016 bytes [750 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 (minor revision not indicated)
Local Time is: Thu Jan 6 08:58:42 2011 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (15960) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off supp ort.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 198) minutes.
Conveyance self-test routine
recommended polling time: ( 6) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_ FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 182 182 021 Pre-fail Always - 7883
4 Start_Stop_Count 0x0032 095 095 000 Old_age Always - 5726
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 200 200 051 Old_age Always - 0
9 Power_On_Hours 0x0032 001 001 000 Old_age Always - 102909
10 Spin_Retry_Count 0x0012 100 100 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 100 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1609
192 Power-Off_Retract_Count 0x0032 199 199 000 Old_age Always - 1260
193 Load_Cycle_Count 0x0032 198 198 000 Old_age Always - 6078
194 Temperature_Celsius 0x0022 109 101 000 Old_age Always - 43
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 51418
200 Multi_Zone_Error_Rate 0x0008 200 200 051 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 11664 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 11664 occurred at disk power-on lifetime: 37372 hours (1557 days + 4 hours )
When the command that caused the error occurred, the device was active or idle .
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 e0 20 64 54 40 Error: ABRT 224 sectors at LBA = 0x00546420 = 5530656
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 e0 20 64 54 57 00 00:01:55.543 READ DMA EXT
25 00 e0 20 64 54 57 00 00:01:55.543 READ DMA EXT
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
Error 11663 occurred at disk power-on lifetime: 37372 hours (1557 days + 4 hours )
When the command that caused the error occurred, the device was active or idle .
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 e0 20 64 54 40 Error: ABRT 224 sectors at LBA = 0x00546420 = 5530656
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 e0 20 64 54 57 00 00:01:55.543 READ DMA EXT
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 62 54 57 00 00:01:55.542 READ DMA EXT
Error 11662 occurred at disk power-on lifetime: 37372 hours (1557 days + 4 hours )
When the command that caused the error occurred, the device was active or idle .
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 e0 20 64 54 40 Error: ABRT 224 sectors at LBA = 0x00546420 = 5530656
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 62 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 62 54 57 00 00:01:55.541 READ DMA EXT
Error 11661 occurred at disk power-on lifetime: 37372 hours (1557 days + 4 hours )
When the command that caused the error occurred, the device was active or idle .
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 e0 20 64 54 40 Error: ABRT 224 sectors at LBA = 0x00546420 = 5530656
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 62 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 62 54 57 00 00:01:55.541 READ DMA EXT
25 00 e0 20 62 54 57 00 00:01:55.541 READ DMA EXT
Error 11660 occurred at disk power-on lifetime: 37372 hours (1557 days + 4 hours )
When the command that caused the error occurred, the device was active or idle .
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 e0 20 64 54 40 Error: ABRT 224 sectors at LBA = 0x00546420 = 5530656
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 e0 20 64 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 62 54 57 00 00:01:55.542 READ DMA EXT
25 00 e0 20 62 54 57 00 00:01:55.541 READ DMA EXT
25 00 e0 20 62 54 57 00 00:01:55.541 READ DMA EXT
25 00 e0 20 62 54 57 00 00:01:55.541 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.