Hi All,
Wondering if someone can take a look at my smartctl out put below, Just had an email saying the error count has increased on my drive, not sure if its failing etc. Have ran the disk through Hard Disk Sentinel and that shows that the drive is perfect 100 health
Thanks
Steve
Wondering if someone can take a look at my smartctl out put below, Just had an email saying the error count has increased on my drive, not sure if its failing etc. Have ran the disk through Hard Disk Sentinel and that shows that the drive is perfect 100 health
Thanks
Steve
Code:
root@freenas:~ # smartctl -a /dev/ada1 smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.1-STABLE amd64] (local build) Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Western Digital Red Device Model: WDC WD30EFRX-68EUZN0 Serial Number: WD-WCC4N5KC9ATC LU WWN Device Id: 5 0014ee 2b8b7b535 Firmware Version: 82.00A82 User Capacity: 3,000,592,982,016 bytes [3.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Jan 21 11:29:49 2018 GMT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (39360) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 395) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x703d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 8 3 Spin_Up_Time 0x0027 180 180 021 Pre-fail Always - 5975 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 54 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 088 088 000 Old_age Always - 9432 10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 54 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 30 193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 163 194 Temperature_Celsius 0x0022 122 118 000 Old_age Always - 28 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0 SMART Error Log Version: 1 ATA Error Count: 5 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 5 occurred at disk power-on lifetime: 9430 hours (392 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 20 c8 09 70 e1 Error: UNC 32 sectors at LBA = 0x017009c8 = 24119752 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 20 c8 09 70 e1 00 10d+12:43:18.561 READ DMA c8 00 20 c8 09 70 e1 00 10d+12:43:14.988 READ DMA c8 00 20 c8 09 70 e1 00 10d+12:43:11.415 READ DMA c8 00 20 c8 09 70 e1 00 10d+12:43:07.842 READ DMA c8 00 20 c8 09 70 e1 00 10d+12:43:04.413 READ DMA Error 4 occurred at disk power-on lifetime: 9430 hours (392 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 20 c8 09 70 e1 Error: UNC 32 sectors at LBA = 0x017009c8 = 24119752 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 20 c8 09 70 e1 00 10d+12:43:14.988 READ DMA c8 00 20 c8 09 70 e1 00 10d+12:43:11.415 READ DMA c8 00 20 c8 09 70 e1 00 10d+12:43:07.842 READ DMA c8 00 20 c8 09 70 e1 00 10d+12:43:04.413 READ DMA c8 00 20 68 06 70 e1 00 10d+12:43:04.394 READ DMA Error 3 occurred at disk power-on lifetime: 9430 hours (392 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 20 c8 09 70 e1 Error: UNC 32 sectors at LBA = 0x017009c8 = 24119752 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 20 c8 09 70 e1 00 10d+12:43:11.415 READ DMA c8 00 20 c8 09 70 e1 00 10d+12:43:07.842 READ DMA c8 00 20 c8 09 70 e1 00 10d+12:43:04.413 READ DMA c8 00 20 68 06 70 e1 00 10d+12:43:04.394 READ DMA c8 00 20 48 fd 6f e1 00 10d+12:43:04.393 READ DMA Error 2 occurred at disk power-on lifetime: 9430 hours (392 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 20 c8 09 70 e1 Error: UNC 32 sectors at LBA = 0x017009c8 = 24119752 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 20 c8 09 70 e1 00 10d+12:43:07.842 READ DMA c8 00 20 c8 09 70 e1 00 10d+12:43:04.413 READ DMA c8 00 20 68 06 70 e1 00 10d+12:43:04.394 READ DMA c8 00 20 48 fd 6f e1 00 10d+12:43:04.393 READ DMA c8 00 20 38 9a d2 e0 00 10d+12:43:04.373 READ DMA Error 1 occurred at disk power-on lifetime: 9430 hours (392 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 20 c8 09 70 e1 Error: UNC 32 sectors at LBA = 0x017009c8 = 24119752 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 20 c8 09 70 e1 00 10d+12:43:04.413 READ DMA c8 00 20 68 06 70 e1 00 10d+12:43:04.394 READ DMA c8 00 20 48 fd 6f e1 00 10d+12:43:04.393 READ DMA c8 00 20 38 9a d2 e0 00 10d+12:43:04.373 READ DMA c8 00 20 c8 08 70 e1 00 10d+12:43:04.371 READ DMA SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
