GBillR
Contributor
- Joined
- Jun 12, 2016
- Messages
- 189
So this is behavior that I haven't seen before, and I am wondering if anyone else has.
A remote server alerted via email to failed SMART test for a particular drive. Relatively young drive (still within warranty period), but I've had drives fail before, so not completly unheard of obviously. I increased the SMART test interval to daily short and weekly long, and also increased the scrub periodicity to daily until I could get to the server to replace the drive. I pulled the drive last week and figured I would benchtest prior to RMA on my ubuntu 16.04 system via esata dock. Now, the SMART tests pass (short and long), and a -ws badblocks completed without error.
Has anyone ever seen a drive suddenly pass SMART tests after failing so many at the exact same spot on the drive? I would be suspicious of the sata cable, but the error occured at the exact same location each test (as I interpret the data anyway). FreeNAS never complained about the volume, only the SMART test failure count. The replacement drive (same cable) has had no issues. Maybe I don't understand what I am reading in the results. I don't see how I could trust the drive in production again... although it has been so long since I've had to RMA a drive, I'm not even sure this would meet their criteria. Any other testing I could do to try to stress the drive? Thoughts on the SMART data? The only abnormal info (beyond the failed tests) that I see in the SMART data is the line below. Based on my limited search, I'm not sure this is related, or if this is just a Ubuntu 16.04 bug.
Full readout here:
Thanks, -Bill
A remote server alerted via email to failed SMART test for a particular drive. Relatively young drive (still within warranty period), but I've had drives fail before, so not completly unheard of obviously. I increased the SMART test interval to daily short and weekly long, and also increased the scrub periodicity to daily until I could get to the server to replace the drive. I pulled the drive last week and figured I would benchtest prior to RMA on my ubuntu 16.04 system via esata dock. Now, the SMART tests pass (short and long), and a -ws badblocks completed without error.
Has anyone ever seen a drive suddenly pass SMART tests after failing so many at the exact same spot on the drive? I would be suspicious of the sata cable, but the error occured at the exact same location each test (as I interpret the data anyway). FreeNAS never complained about the volume, only the SMART test failure count. The replacement drive (same cable) has had no issues. Maybe I don't understand what I am reading in the results. I don't see how I could trust the drive in production again... although it has been so long since I've had to RMA a drive, I'm not even sure this would meet their criteria. Any other testing I could do to try to stress the drive? Thoughts on the SMART data? The only abnormal info (beyond the failed tests) that I see in the SMART data is the line below. Based on my limited search, I'm not sure this is related, or if this is just a Ubuntu 16.04 bug.
Code:
Read SMART Thresholds failed: scsi error badly formed scsi parameters
Full readout here:
Code:
=== START OF INFORMATION SECTION === Model Family: Western Digital Red Device Model: WDC WD20EFRX-68EUZN0 Serial Number: WD- LU WWN Device Id: 5 0014ee 20f4712a4 Firmware Version: 82.00A82 User Capacity: 2,000,398,934,016 bytes [2.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s) Local Time is: Mon May 20 23:10:49 2019 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled Read SMART Thresholds failed: scsi error badly formed scsi parameters === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (25800) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 261) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x703d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 --- Pre-fail Always - 0 3 Spin_Up_Time 0x0027 174 173 --- Pre-fail Always - 4275 4 Start_Stop_Count 0x0032 100 100 --- Old_age Always - 18 5 Reallocated_Sector_Ct 0x0033 200 200 --- Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 --- Old_age Always - 0 9 Power_On_Hours 0x0032 084 084 --- Old_age Always - 12347 10 Spin_Retry_Count 0x0032 100 253 --- Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 253 --- Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 --- Old_age Always - 18 192 Power-Off_Retract_Count 0x0032 200 200 --- Old_age Always - 1 193 Load_Cycle_Count 0x0032 200 200 --- Old_age Always - 174 194 Temperature_Celsius 0x0022 106 106 --- Old_age Always - 41 196 Reallocated_Event_Count 0x0032 200 200 --- Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 --- Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 253 --- Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 --- Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0008 200 200 --- Old_age Offline - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 12347 - # 2 Short offline Completed without error 00% 12314 - # 3 Short offline Completed: read failure 10% 12301 3907025624 # 4 Short offline Completed: read failure 20% 12277 3907025624 # 5 Short offline Completed: read failure 20% 12253 3907025624 # 6 Short offline Completed: read failure 60% 12229 3907025624 # 7 Short offline Completed: read failure 10% 12205 3907025624 # 8 Extended offline Completed: read failure 10% 12188 3907025624 # 9 Short offline Completed: read failure 10% 12181 3907025624 #10 Short offline Completed: read failure 10% 12157 3907025624 #11 Short offline Completed: read failure 20% 12133 3907025624 #12 Short offline Completed: read failure 40% 12109 3907025624 #13 Short offline Completed: read failure 10% 12085 3907025624 #14 Short offline Completed: read failure 60% 12061 3907025624 #15 Short offline Completed: read failure 60% 12037 3907025624 #16 Extended offline Completed: read failure 10% 12019 3907025624 #17 Short offline Completed: read failure 60% 12013 3907025624 #18 Short offline Completed: read failure 60% 11990 3907025624 #19 Short offline Completed: read failure 60% 11966 3907025624 #20 Short offline Completed: read failure 10% 11942 3907025624 #21 Short offline Completed: read failure 20% 11918 3907025624 19 of 19 failed self-tests are outdated by newer successful extended offline self-test # 1 SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
Thanks, -Bill